Short Courses in 2016
Dmitry Bandura, Fluidigm Corporation, Toronto, Canada:
Introduction to mass cytometry
Carsten Engelhard, University of Siegen, Germany:
Plasma-based sources for direct analysis: Fundamentals and applications of ambient desorption/ionization mass spectrometry
Joachim Franzke, Leibniz-Institut für Analytische Wissenschaften – ISAS, Dortmund, Germany:
Dielectric barriers for analytical chemistry
Bente Gammelgaard, Department of Pharmacy, University of Copenhagen, Denmark:
Basic separation methods for speciation analysis
Alexander Gundlach-Graham, ETH Zürich, Switzerland and Steven Ray, Indiana University, Bloomington, Indiana, USA:
PART I: Plasma-source time-of-flight and distance-of-flight mass spectrometry: Fundamentals, instrumentation, and applications
Gary M. Hieftje, Indiana University, Bloomington, USA:
Signal-to-noise enhancement methods for atomic spectrometry
Sandra Mounicou, Chargée de Recherche CNRS, Pau, France:
Analytical strategies for metalloproteins analysis
Sascha Novak, University of Münster, Germany:
Analysis of energy storage materials: Recent trends and applications
Rosario Pereiro, University of Oviedo, Spain:
Fundamentals and applications of depth profile analysis by glow discharge spectrometries for beginners
Steven Ray, University of Buffalo, USA and Alexander Gundlach-Graham, ETH Zürich, Switzerland:
PART II: Plasma-source time-of-flight and distance-of-flight mass spectrometry: Fundamentals, instrumentation, and applications
James Ranville, Colorado School of Mines:
Coupling field flow fractionation with single particle ICP-MS
Ilia Rodushkin, ALS Scandinavia, Luleå, Sweden:
Sources of contamination and remedial strategies
Davy Rousset, Institut National de Recherche et de Sécurité (INRS), Nancy, France:
How to collect relevant ambient and occupational air samples for plasma based spectrochemical analysis
Rickard E. Russo, Lawrence Berkeley National Laboratory, Berkeley, USA:
Title to be confirmed
Michael Sperling, University of Münster, Germany:
Speciation analysis. Why, when and how?
Jose Luis Todoli Torro, University of Alicante, Spain:
1. Approaches to efficiently introduce liquid samples into ICP instruments
2. Matrix effects in ICP techniques
