General Information Invited Speakers Short Courses


Short Courses in 2016


Dmitry Bandura, Fluidigm Corporation, Toronto, Canada:
Introduction to mass cytometry

Carsten Engelhard, University of Siegen, Germany:
Plasma-based sources for direct analysis: Fundamentals and applications of ambient desorption/ionization mass spectrometry

Joachim Franzke, Leibniz-Institut für Analytische Wissenschaften – ISAS, Dortmund, Germany:
Dielectric barriers for analytical chemistry
 
Bente Gammelgaard, Department of Pharmacy, University of Copenhagen, Denmark:
Basic separation methods for speciation analysis
 
Alexander Gundlach-Graham, ETH Zürich, Switzerland and Steven Ray, Indiana University, Bloomington, Indiana, USA:
PART I: Plasma-source time-of-flight and distance-of-flight mass spectrometry: Fundamentals, instrumentation, and applications
 
Gary M. Hieftje, Indiana University, Bloomington, USA:
Signal-to-noise enhancement methods for atomic spectrometry

Sandra Mounicou, Chargée de Recherche CNRS, Pau, France:
Analytical strategies for metalloproteins analysis

Sascha Novak, University of Münster, Germany:
Analysis of energy storage materials: Recent trends and applications
 
Rosario Pereiro, University of Oviedo, Spain:
Fundamentals and applications of depth profile analysis by glow discharge spectrometries for beginners

Steven Ray, University of Buffalo, USA and Alexander Gundlach-Graham, ETH Zürich, Switzerland:
PART II: Plasma-source time-of-flight and distance-of-flight mass spectrometry: Fundamentals, instrumentation, and applications

James Ranville, Colorado School of Mines:
Coupling field flow fractionation with single particle ICP-MS

Ilia Rodushkin, ALS Scandinavia, Luleå, Sweden:
Sources of contamination and remedial strategies
 
Davy Rousset, Institut National de Recherche et de Sécurité (INRS), Nancy, France:
How to collect relevant ambient and occupational air samples for plasma based spectrochemical analysis

Rickard E. Russo, Lawrence Berkeley National Laboratory, Berkeley, USA:
Title to be confirmed

Michael Sperling, University of Münster, Germany:
Speciation analysis. Why, when and how?​

Jose Luis Todoli Torro, University of Alicante, Spain:
1. Approaches to efficiently introduce liquid samples into ICP instruments
2. Matrix effects in ICP techniques




9th Nordic Conference on Plasma Spectrochemistry
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